Scanning Electron Microscope Jeol JSM 6510 (year of installation: 2014).
Technical Data

JEOL JSM-6510
The high-resolution scanning electron microscopes of the JSM-6510 series are cost effective and powerful at the same time. An individually configured, well coordinated user interface makes it easy to get oriented quickly and is intuitive to operate.A range of effective automatic functions (focus, contrast and brightness, astigmatism correction, source and column adjustments) simplify routine work and make it possible even for novices to quickly achieve optimal results.

Features

Resolution: 3.0 nm (30 kV)
Magnification: 5x to 300,000x
Image mode: Secondary electrons, backscattered electrons
Accelerating voltage: 0.5 kV to 30 kV
Filament type: W-type
Filament Factory pre-centered filament
Electron gun: Fully automated, manual override
Condenser lens: Zoom condenser lens
Objective lens: Super conical objective lens
Objective lens apertures: 3 stages, XY fine adjustable
Stigmator memory Built in
Electrical image shift +/- 50 um (WD=10mm)
Auto functions Focus, brightness, contrast, stigmator
Tilt: 10. to 90 deg.
Rotation: 360 deg.
Multi image display 2 images, 4 images
Digital zoom Built in
Dual magnification Built in
Pumping system: Fully automated, RP, DP

Oxford EDS Microanalysis System

Features

Detector: 10 mm2 SDD Detector - x-act
Detects elements from Be to Pu
Premium resolution of 125 eV available, guaranteed on your SEM
Resolution measured in compliance with ISO 15632:2012
Compatible with INCA and AZtec EDS analysis software
Reliable AutoID for element identification
Accurate quant – all count rates
Stability guaranteed from 1,000 to 100,000 cps – peak shift and resolution change <1 eV
Full software correction at very high count rates including pile-up correction
Excellent low energy analysis with detection from Be to Pu
Resolution guaranteed on SEM at MnKa, FKa, and CKa

Aztec and Inca microanalysis software.